Statistical Methods for Process Improvement both business and industrial (SPC 2) Duration Three & Half Days

(Prior attendance to SPC 1 or similar is mandatory)

Course Benefits

Tools demonstrated in this course will:

                 Provide delegates with the tools that provide better analysis of management systems, so as to set direction and action that is measurable.

                 Enable delegates to determine opportunities for process improvement, for both business and industrial processes.

                 Provides delegates with better ways of reporting effectiveness and efficiency of system processes, a requirement of ISO 9001 and IATF 16949.

Course Content

                     The Central Limit Theorem

                     Theory of Hypothesis Testing

                     Properties of the T Distribution

                     Chi-Square Distribution

                     Cusum Control Charting Methods

                     F Test Variance Ratio Test (F Test)

                     The Mann-Whitney U Test

                     The Spearman Correlation for Ranked Data

                     Pearson Correlation

Who should attend?

Personnel who have prior experience in the use and application of Control Charts, and have attended SPC 1 or similar and are involved in process development/improvement. Also, personnel involved in the preparation of management reports and the analysis of management systems.

Learning Objectives

Upon completion of this course, participants will be able to:

                 Explore, characterize and identify problems and trends in data using graphical tools including 

                 Use descriptive statistics to summarize data

                 Understanding the concepts of hypothesis testing, confidence intervals,

                 Identifying the appropriate statistical test based on the study objective

Delegates Receive a H & M Certificate on successful completion of a forty-five-minute multiple-choice examination, competent mark is 60%.